| scanning electron microscope. |
| a device in which the specimen is examined point by point directly in a moving electron beam, and electrons reflected by the specimen are used to form a magnified, three-dimensional image on a television screen. Abbreviation: SEM |
| scan·ning electron microscope (skān'ĭng) n. Abbr. SEM An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and the secondary electrons produced by it. |
| SEM abbr. scanning electron microscope |
scanning electron microscope n.
Abbr. SEM
An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and the secondary electrons produced by it.
SEM abbr.
scanning electron microscope
scanning electron microscope  (skān'ĭng) Pronunciation Key
An electron microscope that moves a narrowly focused beam of electrons across an object and detects the patterns made by the electrons scattered by the object and the electrons knocked loose from the object. From these patterns a three-dimensional image of the object is created. |
SEM
The semantic specification language for COPS.
["Metalanguages of the Compiler Production System COPS", J. Borowiec, in GI Fachgesprach "Compiler-Compiler", ed W. Henhapl, Tech Hochs Darmstadt 1978, pp. 122-159].
| SEM scanning electron microscope |
